IEC 61189-2-720-2024.docx

《IEC 61189-2-720-2024.docx》由会员分享，可在线阅读，更多相关《IEC 61189-2-720-2024.docx（24页珍藏版）》请在三一办公上搜索。

1、IECIEC61189-2-720Edition1.02024-03INTERNATIONA1.STANDARDNORMEINTERNATIONA1.EorinsideTestmethodsfore1.ectrica1.materia1.s,circuitboardsandotherinterconnectionstructuresandassemb1.ies-Part2-720:DetectionofdefectsininterconnectionstructuresbymeasurementofcapacitanceMethodesdessaipourIesmateriauxe1.ectr

2、iques,Iescartesimprimeesetautresstructuresdinterconnexionetensemb1.es-Partie2-720:DetectiondedfautspresentsdansIesstructuresdinterconnexionparmesuragedeIacapaciteTHISPUB1.ICATIONISCOPYRIGHTPROTECTEDCoPyright2024IEC1Geneva,Switzer1.andAJ1.rightsreserved.UnteesO1.herWigespecified,nopartofthisPUb1.iCaI

3、kinmaybereproducedoruti1.izedinanyformOfAanymeans,e1.ectronicor11eca11ca1.,inc1.udingpoxxopyingandmcrofim.WnbOU1.permissioninWEEgfromeitherIECofIECmemberNationa1.CommieinIhecountryoftherequester.I!youhaveanyquestionsaboutIECcopyrighthaveanenquiryaboutOb1.aningancona1.rightstothsPUbtCagn.pte-ascontac

4、ttheaAJressbdoworyour1.oca1.IECmc11crNatKXIa1.COmn1.inCfxfurtherinformation.Droitsdereproductionr6sfv6s.Saufirxic1.ioncontraire.aucunepartiedece1.tepub1.icationnePeU1.!rereprodi1.eni*seesousqueuetof(11equecesoi1.etparaucuprocede.61ctron*queomecankjue,ycompe1.sIapotocopiee1.Iesm*croms.sansaccorde1.td

5、e1.,IECOUduCOmCQnabona1.de11ECdupaysdudman6eur.SiVoUSavezCfeSquestionssufIecopyrightde11ECOd&VOUSJ6s1.fezObtenrdsdrosSUPP1.QfnentaMe6surcedepub1.caron.UtiHseztescocxxnesCaPmSouco11taezIeCcmitd11atiade11CdevoirepaysderesidenceCSeaetanatTd.:“1229W02113.ruedoVarcmbciriecchCH-1211Geneva20ww.1.ec.cSwitZe

6、rIancIAbouttheIECTheIntornationa1.E1.cctrotcchnica1.Commisskxi(IEC)isthe1.eadingg1.oba1.organizationthatproparcsandpub1.ishesIntefnabonaJStandardstora1.1.e1.ectrics,eectroncandrentedtechno1.ogies.AboutIECpub1.icationsTetechnica1.contentaIECpub1.icationsiskep(UndefconstantreviewbyIbeIEC.P1.easemakesu

7、rethatyouhavethe1.atesteddion.aor.JustPub1.sddtasa1.1.newpubcato5reteasedAvai1.ab1.eon1.ineandOnC8amonthWefnai1.IECCustomerServiceCentre-webstore,ec.ch-escHyouwishtogrvUSyourW1.ckonthispub1.icationorneedfurther35ststanco.p1.easeyourneds.E1.ectropedta-www.e1.edropefia.orgTbcwor1.dsIcacingon1.inedicbo

8、rwryonccctrotcchnoogy.1.aningmorethan22500termnotogtetfentriesinEng1.sa11dFrenchwithOqUZa(Cn1.tefmSin25addf1.kxaUnu9gcsA1.soKnOWnasEeInternationa1.E9drotech11ca1.VocabUary(IEV)o11*11.Aproposde11EC1.aCOmfnISsonEJectrotechniqueIntefnaDonaIe(ICes1.IaPfgrnIEeorganisationmodiaequ1.ahoreetPubI哈desNormesIn

9、grnagna1.eSpourtoutcequatrastore.iec.chadVsearchform1.arhcrctcva11coPefEmdeIrouvcrdc$PUbfCi1.bQnSIECnUHisantdiffre11tsCfiteresInUmfOdereference,1.itod,udcs.E11cdo1111caussdcsinformationssurkPfoje1.Sa1.esPUbICaconsres1.or.ec.ch,justpubhsedRostczinformdsurcs11ouvccspub1.icationsIECJustPub1.isheddwaIeS

10、ouve5puWica1.o11sparuesDisponibtecnIigncCtu11ckisParmotsparCmaJ1.ServiceC1.ientswebsore.*ec.chccSivous66reznousdonnerwurderecherche1nsUWzgratui1.ementIousIeeaerusdesPUbHMiO检SyrnbotesgraphjqusetegossairAyeCunabomement.VOU6aurezEU)OUr$accd$au11COntCnU占jouradp*VQSbcsoi11s.E1.ectropedmwww.e1.ctropetaorg

11、1.epremierdictionaifecf61.ecrocnoioeen1.neaumonde,avecp1.usde22500a11ctesIBEnOogqusenang1.ais1efranais.nsiqe1.esefmes6quiva1.ensdans25Ianguesaddibo11e*sE9a1.mniappen1.0202403INTERNATIONA1.STANDARDNORMEINTERNATIONA1.Eco1.ourinsideTestmethodsfore1.ectrica1.materia1.s,circuitboardsandotherinterconnecti

12、onstructuresandassemb1.ies-Part2-720:DetectionofdefectsininterconnectionstructuresbymeasurementofcapacitanceMethodesdessaipourIesmateriauxe1.ectriques,Iescartesimprimeesetautresstructuresdinterconnexionetensemb1.es-Partie2-720:DetectiondedefautspresentsdansIesstructures(!interconnexionparmesuragedeI

13、acapaciteINTERNATIONA1.E1.ECTROTECHNICA1.COMMISSIONCOMMISSIONE1.ECTROTECHNIQUEINTERNATIONA1.ECS31.180ISBN978-2-322-83271Warning!F4akesurethatyouobtainedthispub1.icationfromanauthorizeddistributor.Attention!Veui1.1.ezvousassurerquevousavezobtenucettepub1.icationviaundistributeuragree.tfR*qcAr3o1.3的fu

14、!bEht*S9gvCsiescrUg8debCoFBcCnE1.Mh:4E2cnjrionaCONTENTSFOREWORD31 Scope52 Normativereferences53 Termsanddefinitions54 Objective.55 Testspecimen66 Testmethod67 Testprocedures78 Report8AnnexA(informative)Thecapacitivetestmethod9A1Testschematic9rFigure 1 -Capacitancedifferencedependingonthedefectofmous

15、ebite6Figure 2 -Testspecimen6Figure 3 -SchematicoftheCaPaa1.ancetestmethod7FigureA.1-Testschematic9TaWe1-DefGignofuppercase8TabAeA.1-Testresu1.t(orthetestspecimen10INTERNATIONA1.E1.ECTROTECHNICA1.COMMISSIONTESTMETHODSFORE1.ECTRICA1.MATERIA1.S,CIRCUITBOARDSANDOTHERINTERCONNECTIONSTRUCTURESANDASSEMB1.

16、IES-Part2-720:DetectionofdefectsininterconnectionstructuresbymeasurementofcapacitanceFOREWORD11TheIrrtefnationaiEec1.roiechnica1.Commissjon(IEC)isaWoddWkfeOrgarizabonforstandardisationCOfrpcisingaM11abo11a1.rotech11ca1.nmrtts(CNationa1.Co11monacooperationona1.1.questionsconcerningstandardizationinth

17、eCicetnCa1.anddoc1.ro11ic潮ds.ToIhjSendandinaddontooteractcvUies.IECpuWsesMternationa1.Standards.Technica1.SPeCdEatk)ns.TeChnkaReports.PUbIiCbfAvai1.ab1.eSpecifications(PAS)andGuides(hereafterreferredtoas1ECPUWiCatiOMS)Thcrrearatkx)mittees;anyIECNationa1.CommitteeIniefestedinthesubjectdea1.twthmayPam

18、oPa衿ntharaxxyworkInternationa1.,aovemmenta1.andnon-Qvernm111.aOnJaniZatjOn61.iaisingwithteIECa1.sopa11icipateinthisPrepafacon.IECCd1.abofatesCtoee1.ytheIniemationaiOfgan1.zatkxikxStandardization(ISO)inaccordancewthoondnxsdtrminedbyagreementCetweentheMoorQaniZaIkX1.S2)Thekxma1.dedionsoragreementso!IE

19、Contechnica1.mattersexpress,asnear1.yasPgMiW*animanabona!consensuso1.OPin1.ononthere1.evantsubjectss1.mitteehas田PreSen1.at1.Ontroma1.i11xc5todIECNatkxia1.C(XnEHoeS3IECPub1.icationshaveIhekxmofrecommendationsfxinernatia1.useandareaccedbyIECNaiionaJCommt1.8Srthatsense.Witea1.1.reasonab1.etto11saremade

20、toensurethatthetechnica1.n1.e11tofIECPub1.icationsisaccrae.IECcannotbeheonaJCommitteesundertaketoappIECPub1.ica1.ioasIraneparen1.1.ykthemaximumextentposab1.einIheirnationa1.andregtona1.PUb1.catjOx.AnydvergencebetweenanyIECPub1.cabonandtheCorrespondngnationa1.v崛anyattcsta!oncaixbodies.61AJIUSorSshou1

21、.densurethattheyhavethe1.atestodikofthspub1.ication.7NoIiabi1.tysha1.1.attachtoIECoritsdireckxs.emp1.oyees,servantsOfagentsindSngindividua1.expertsandmembersmitteesandIECNabona1.Committeesforanypersona1.11ury.propertydamageort!herdamageofanynatureMaisoever.whetherdree!orindirec!.orfarcosts(inducing1

22、.ega1.1.ewandexpensesarisingoutorIhePUb1.eaUOn.usecA.orre1.anceupon.thsIECPub1.icationoranyoWfIECPubtcabons.8Attentionisdrawnk)theNocmaiwereferencescedInthispuMication.UseOI1.here4ererxdpub1.icationsIndispensaWeforthcorrectapp*caboofthisPUbheabOn9)IECdrawattentiontotheposst)iitythattheIEPkXnCEaIkxio

23、fthisdocumentmayinvo1.vetheuseof（八）Paten1.(三).IECtakesnopositionConCem1.ngtheevidence,va1.idty,orapp1.icabi1.ityotanyCUjmedpatentrightsnrespectthereofAsofIhodax?dPUbIkatkxio!hisCiOCUrncntIEChadn(zrcc6,cdnoticeof（八）Partent、Whi6mayberequiredtoimp1.ementthisdbcumen1.HOWeVer.imKmenf9arecautionedthatthis

24、maynotreren1.the1.atesti11kr11aiio11,whichmaybeobtainedSrOmthePaXJntdatabaseavai1.ab1.eathttps*,gcES.ioucIECsha1.1.notbehe1.dreepon&b1.e1.otKferrtifyinganyora1.suchpatentrights.IEC611892720hasbeenpreparedbyIECmittee91:E1.ectronicsassemb1.ytechno1.ogy.ItisanInternationa1.Standard.ThetextofthisInterna

25、tiona1.Standardisbasedonthefo1.1.owingdocuments:Dra11Reportonv!ing91/1923.FDIS91/1934.RVOFu1.1.informationonthevotingfortheapprova1.ofthisInternationa1.Standardcanbefoundinthereportonvotingi11dscatedintheabovetab1.e.The1.anguageusedforthedeve1.opmentofthisInternationa1.StandardisEng1.ish.Thisdoc11wt

26、hasbeendraftedinaccordancewiththeISOIECDirectives.Part22,anddeve1.opedinaccordancewithISO.1ECDirectives,Part1andISQ,IECDirectives.IECSupp1.ement,avarfab1.eatvww.iec.ch,me11)bers-exprtsrefdocs.Themaindocumenttypesdeve1.opedbyIECaredescribedingreaterdetai1.atww.iec.ch.,pubfcca1.ions.A1.istofa1.1.parts

27、intheIEC61189series,pub1.ishedunderthegenera1.tit1.eTestmethodsfore1.ectrica1.(natc11a)s.drcurtboardsandOnWSefCon水侬OnSVUCMeSandassemMgcanbefoundonthoIECwebsite.FuturestandardsnIhisserieswi1.1.carrythenewgenera1.tit1.eascitedaboveTit1.esofexistingstandardsinthisseriesvi1.beupdatedatthetimeofthenexted

28、ition.Thecom11rtteehasdecidedthatthe11tentsofthisdocumentwi1.1.remainunchangedunti1.thestabi1.itydateindicatedontheIECWebSitCunderhttp：JMebS1.Orc.icc.ch”mIhcdatare1.atedtothespoficCtocumont.Atthisdate,thedocumentwi1.1.be reconfirmed, withdrawn,or revised.IMPORTANT一Thco1.ourinside1.ogoonthevrpageofth

29、isdocumentindicatesthatitcontainsco1.ourswhicharcconsideredtobeusefu1.forthecorrectunderstandingofitscontents.Usersshou1.dthereforeprintthisdocumentusingaco1.ourprinter.TESTMETHODSFORE1.ECTRICA1.MATERIA1.S,CIRCUITBOARDANDOTHERINTERCONNECTIONSTRUCTURESANDASSEMB1.IES-Part2-720:Detectionofdefectsininte

30、rconnectionstructuresbymeasurementofcapacitance1 ScopeThispartofIEC61189providesamethodtoeva1.uateSPeerfiCcharacteristicsOfdrcu1.boardsbymeasuringtheCaPaCitaneCbetweenconductortracesandagroundp1.aneandcanbeusedtorqaJtativecomparisonofatestspecimentoareferenceboard.Thismethodistintendedforquantitativ

31、emeasurementsandIorassessmentofnformitytoaspecification.2 NormativereferencesThefo1.1.owingdocumentsarereferredtointhetextinsuchawaythatsomeora1.1.oftheircontentconstitutesrequirementsofthisdocument.Fordatedreferences,Oniytheeditioncrtedapp1.ies.Forundatedreferences,the1.atesteditionofthereferencedd

32、ocument(inc1.udinganyamendments)app1.ies.IEC60194-2.Printedboardsdesign,manufactureandassemb1.y-Vocabuiary-Pan2:Commonusaffcinectrsas、府0asprintedboardande1.ectronicassombty除ChnHogies3 TermsanddefinitionsForthepurposesofthiscmnt.thetermsanddefinitionsgivenGIEC1.942app1.yNotermsanddefinitionsarefcsted

33、inthisdocument.ISOandIECmaintaintermino1.ogica1.databasesforuseinstandardizationatthefo1.1.owingaddresses: IECEiec1.ropedia:avai1.ab1.eath11p,wwweectropeda.org. ISOOnbnebrows*ngp1.atform:avai1.ab1.eath11p7ww.isoorg.,obp4ObjectiveFortestinge1.ectrica1.characteristicsofdrcurtboard,genera1.1.yaneectrca

34、JOPerVShorttestthatsha1.1.measuretheresistancebetweennetssthemamtestmethodThisOP(KVSh(X1.testISPaSSib1.COntytokx)katthefassihefai1.ofcircuitsandnotto1.ookforanyre1.iabi1.ityissuesofcircuitboard1.ikeasmousebite.don.void,andcrack.Thercrore.thegenera1.e1.ectrica1.testhasabmtation.A1.ongwiththecapacitan

35、cetestmethod,theO1.CCtrICaItQStmethodsha1.1.chocktheexistingre1.iabi1.ityissuesofrcuitboardsandthisstandardizationoftheadditiona1.p11jntstageIt0posab1.etoaccurate1.ymeasurethedifferencesinthecapacitanceva1.uescircuitboardsbeforeanda1.terthere1.iabi1.itytest.This吟SUf1.iciontforthedeve1.opmentstageand

36、ro1.iaMitytestingratherthaninpfoductontestingbecauseofthe1.ongtesttimeofe1.ectrica1.test.OtherthanthePfOmngcontactissues,thereisnoPrOHemwiththemeasurementuncertainty.Itispossib1.etokoktordetectssuchasopesort,mousebte,de1.amination,void,andsoonbyana1.ysingthetestdefectnets.In100kingforthecapacitancet

37、estmethod,tShowSthecapatanceOitferencedependingonthepadwidth,padteng1.h,andpaddistanceasshownFigure1.Figure1ShOwSthedefectofmousebite.OmensonsInmIcrorTMIIifneCfesFigure1-Capacitancedifferencedependingonthdefectofmousebit5TestspecimenFigure2ShOYzSthetestspecimenv/ithtoptestpadsandbottomtestpads.Itsha

38、1.1.bpreparedtotestrea1.circuitboardsandtestcouponswithawarpagespecificationof1.essthan2mmtorimprovingadhesionwiththegroundmeta1.p1.ate.ToptestpadsBof1.omtestpadsFigure2-Testspecimen6TestmethodFigure3ShOwSIheschematicofthecapacitancetestmethodformeasuringcapacitanceusingacapacitancetestersuchasan1.C

39、RmeterandImpedancetester.Aftercontactingthegroundmeta1.p1.ateofonside,thecapacitanceofa1.1.ofpadsoftheothersideshaibetested.Thetopprobingtestsandthbottomprobingtestsareconducted.PrOtMn9portirCapacitancetesterformeeauf1.ngthecep-18Groundmetop1.ate（八）Topprobingtestsfora1.1.toppads(b)Bottomprobingtests

40、tora1.1.bottompadsFigure3-Schematicofthecapacitancetestmethod7 TestproceduresThespecimensha1.1.beattached(othegroundmota1.p1.atewithoutanyattachedmateria1.s,anditmayneedthegrndmeta1.p1.atewiththevacuumsuctionho1.esforimprovingtheattachmentbetweentestspe11enandgroundmeta1.p1.ate.The2-portcapatancetes

41、tersha1.1.be1111ectedateachprobingpointandgroundmeta1.p1.ate.If1.ookingatthetestschematicinFigureA.1.afterattachingthetestspecimentothegroundEGIa1.p1.ate,the2portimpedancetestersha1.1.be1111ectedtothepadsofthtestspecimenandgroundmeta1.p1.ate.Thgroundmeta1.p1.atesha1.1.bethecommongroundandthecapacitancesha1.1.bemeasuredateachone-sideprobingpoint.A1.so,itisnecessarytomeasureateachother-sideprobingpoint.Afterthat,itsha1.ana1.yzea1.1.thetestresu1.tsbymparingthaverageerrorrat100fa1.testspecimens.Thetestsequencestotestthecapacitanceofcircuitboardsareasfo1.1.ows