RF射频电路设计英文课件Lecture09-RFICandSOC.ppt
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1、Lecture 9,Richard Li,2009,1,1.Interference and Isolation o Existence of Interference in Circuitry o Definition and Measurement of Isolation o Main Path of Interference in a RF Module o Main Path of Interference in a IC Die2.Shielding for a RF Module by a Metallic Shielding Box3.Strong Desirability t
2、o Develop RFIC4.Interference Going Along IC Substrate Path o Experimentation o Trench o Guard Ring5.Solution for Interference Coming from the Sky6.Common Grounding Rules for RF Module and RFIC Design o Grounding of Circuit-branches or Blocks in Parallel o DC Power Supply to Circuit-branches or Block
3、s in Parallel7.Bottlenecks in RFIC o Low Q Inductor and Possible Solution o“Zero”Capacitors o Bonding Wires8.Prospect of SOC9.What is Next?Appendixes o Notes about RFIC layout o Calculation of Quarter Wavelength o Progress of Electronic Industry,Lecture 9:RFIC&SOC Richard Chi-Hsi Li 李缉熙 Email:,Lectu
4、re 9,Richard Li,2009,2,o Existence of Interference in Circuitry,1.Interference and Isolation,o Definition and Measurement of Isolation,Isolation=-Attenuation of interference.,dB,dB,Lecture 9,Richard Li,2009,3,o Main Path of Interference in a RF Module,o Main Path of Interference in a IC Die,*From th
5、e sky!,*From the“ground”-the substrate!,Lecture 9,Richard Li,2009,4,o Definition and Measurement of Isolation o Main Path of Interference in a RF Moduleo Main Path of Interference in a IC Die,Lecture 9,Richard Li,2009,5,2.Schielding for a RF Module by a Metallic Shielding Box,Lecture 9,Richard Li,20
6、09,6,3.Strong Desirability to Develop RFIC,The great advantages of the IC are:Greatly reduced cost,down by at least 10 times;Greatly reduced size,down more than 1000 times;Greatly enhanced reliability of product,by at least 100 times.,Lecture 9,Richard Li,2009,7,4.Interference Going Along IC Substra
7、te Path,o Experimentation,Lecture 9,Richard Li,2009,8,Table 1 Interference attenuation or isolation when interference signal goes along IC substrate pathS21-40 dB,when f=10 MHz,S21-30 dB,when f=100 MHz,S21-20 dB,when f=1000 MHz,Lecture 9,Richard Li,2009,9,o Trench,Figure 5 Trenching of a RF block is
8、 to dig a deep ditch encompassing the RF block,Main PCB,One RF block,Externalinterferencesource,IC substrate,A deep ditch,Internalinterferencesource,Lecture 9,Richard Li,2009,10,o Guard Ring,Lecture 9,Richard Li,2009,11,Table 2 Comparison of interference attenuation or isolation between the cases wi
9、th and without P+guard ring Without P+guard ringWith P+guard ring Frequency S21-40 dB,-80 to-70 dB,10 MHz,S21-30 dB,-60 to-55 dB,100 MHz,S21-20 dB,-40 dB,1000 MHz.,Lecture 9,Richard Li,2009,12,Table 1 Typical width of guard ring and spacing between guard rings in a RFIC layoutItem Value.Spacing betw
10、een RF block and P+guard ring,S1=10 m,Spacing between P+guard ring and deep N-well,S2=1 m,Width of P+guard ring,WP=10 m,Width of deep N-well guard ring,WN=10 m.,Lecture 9,Richard Li,2009,13,5.Solution for Interference Coming from the Sky,Lecture 9,Richard Li,2009,14,Lecture 9,Richard Li,2009,15,6.Co
11、mmon Grounding Rules for RF Module and RFIC Design,o Grounding of Circuit-branches or Blocks in Parallel,Lecture 9,Richard Li,2009,16,Lecture 9,Richard Li,2009,17,o DC Power Supply to Circuit-branches or Blocks in Parallel,Lecture 9,Richard Li,2009,18,Lecture 9,Richard Li,2009,19,7.Bottlenecks in RF
12、IC Design,o Low Q Inductor and Possible Solution,Spiral inductor,Lecture 9,Richard Li,2009,20,Skin effect,*Possible reasons of Low Q value,For copper,0.66 m,when frequency=10 GHz,6.6 m,when frequency=100 MHz.,T 0.1 m.(Thickness of the metal layer in IC),Unfortunately,the experiments indicate that th
13、e thin thickness of the metal layer is not the main reason that brings about the low Q value of the IC spiral inductor.,2)Attenuation due to the Existence of Substrate,Lecture 9,Richard Li,2009,21,3)Flux Leakage,Lecture 9,Richard Li,2009,22,4)Flux Cancellation,Lecture 9,Richard Li,2009,23,*Possible
14、Solution of Low Q Value,-Compensation of negative resistance,However,it is not so simple in actual engineering design.The difficult points are:Generating a negative resistance;Ensuring that there is not negative resistance outside the expected bandwidth;The remained negative resistance inside the ba
15、ndwidth must be kept below a small positive value;Reducing current consumption of generating negative resistance,which is usually done by an active device;Handling the noise generated due to the existence of the active device.,Lecture 9,Richard Li,2009,24,o“Zero”Capacitors,o Bonding Pad&Wires,Lectur
16、e 9,Richard Li,2009,25,8.Prospect of SOC,o Remove All the Bottlenecks in RFIC Design,The main bottlenecks in RFIC design are:Enhancing the low Q value of the spiral inductor;Developing a“zero”capacitor directly on the RFIC chip;Modeling the bonding wire with higher accuracy.,o Continue to Study Isol
17、ation,Studying isolation between RF blocks,Studying isolation between digital blocks.,Studying isolation between RF and digital blocks.,Lecture 9,Richard Li,2009,26,9.What is Next?,Lecture 9,Richard Li,2009,27,Appendixes,o Runner,*Length and width,A.1 Notes About RFIC Layout,*Multiple runners or cur
18、ves in parallel,*Style of runner:As short as possible,*Smooth of the runner:As smooth as possible,*Placement of runners:Do perpendicular,not parallel as possible,*Corner of the runner:As smooth as possible,Lecture 9,Richard Li,2009,28,*Runners in parallel,*Runner in parallel with grounded edge,Lectu
19、re 9,Richard Li,2009,29,*Style of runner,“Nice looking”-NO!“E-W,S-N”-NO!,As short as possible-Yes!,A,B,A,B,Figure A.5 Two runner styles from A to B.,Lecture 9,Richard Li,2009,30,Lecture 9,Richard Li,2009,31,*Comparison of even and un-even runners,l,A,B,W0,ZO,ZL,(a)An even runner:W0=6 m,Z0=50.2 ohm,l
20、=100 m,C,D,W1,W0,l/2,l/2,Z0,Z1,ZL,(b)An uneven runner:W0=30 m,Z0=21.2 ohm,l/2=50 m,W1=6 m,Z1=50.2 ohm,l/2=50 m,ZC=48.4 j7.9 ohm,ZL=50+j0 ohm,ZA=50+j0 ohm,ZL=50+j0 ohm,Additional Capacitor:In seriers:-j7.9 ohm=20.15 8.39 3.47 2.01 pF 1.0 2.4 5.8 10.0 GHzIn parallel:-j7.9 ohm=20.15 8.39 3.47 2.01 pF 1
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