IEC 61189-2-720-2024.docx

IECIEC61189-2-720Edition1.02024-03INTERNATIONA1.STANDARDNORMEINTERNATIONA1.EorinsideTestmethodsfore1.ectrica1.materia1.s,circuitboardsandotherinterconnectionstructuresandassemb1.ies-Part2-720:DetectionofdefectsininterconnectionstructuresbymeasurementofcapacitanceMethodesd'essaipourIesmateriauxe1.ectriques,Iescartesimprimeesetautresstructuresd'interconnexionetensemb1.es-Partie2-720:DetectiondedfautspresentsdansIesstructuresd'interconnexionparmesuragedeIacapaciteTHISPUB1.ICATIONISCOPYRIGHTPROTECTEDCoPyright©2024IEC1Geneva,Switzer1.andAJ1.rightsreserved.UnteesO1.herWigespecified,nopartofthisPUb1.iCaIkinmaybereproducedoruti1.izedinanyformOfAanymeans,e1.ectronicor11>eca11ca1.,inc1.udingpoxx>opyingandmcrofim.WnbOU1.permissioninWEEgfromeitherIECofIECmemberNationa1.CommieinIhecountryoftherequester.I!youhaveanyquestionsaboutIECcopyrighthaveanenquiryaboutOb1.aningancona1.rightstothsPUbtCagn.pte-ascontacttheaAJressbdoworyour1.oca1.IECmc11crNatKXIa1.COmn1.inC«f<xfurtherinformation.Droitsdereproductionr6sfv6s.Saufirxic1.ioncontraire.aucunepartiedece1.tepub1.icationnePeU1.!rereprodi1.eni*seesousqueuetof(11equecesoi1.etparaucuprocede.61ctron*queomecankjue,ycompe1.sIapotocopiee1.Iesm*croms.sansaccorde1.tde1.,IECOUduCOmCQnabona1.de11ECdupaysdudman6eur.SiVoUSavezCfeSquestionssufIecopyrightde11ECOd&VOUS<J6s1.fezObtenrdsdro<sSUPP1.QfnentaMe6surcedepub1.caron.UtiHseztescocxxnesCaPmSouco11taezIeCcmitd11atiade11CdevoirepaysderesidenceCSeaetanatTd.:“1229W02113.ruedoVarcmbcir<iecchCH-1211Geneva20w"w.1.ec.cSwitZerIancIAbouttheIECTheIntornationa1.E1.cctrotcchnica1.Commisskxi(IEC)isthe1.eadingg1.oba1.organizationthatproparcsandpub1.ishesIntefnabonaJStandardstora1.1.e1.ectrics,e<ectroncandrentedtechno1.ogies.AboutIECpub1.icationsTetechnica1.contentaIECpub1.icationsiskep(UndefconstantreviewbyIbeIEC.P1.easemakesurethatyouhavethe1.atesteddion.a<xxredmoranamendmentmighthavebeenPUbhSedIECpub1.icationssearch-WebstorejecxhadvsearchformTheadvancedsearchenab1.estofindIECpub1.icationsbyavarietyo1c11tenaIreterencerximbertext.technica1.oommi!tee.Rateogivesinformationonprojects,rep1.acedandwWdra*pub1.icationsIECJustPub1.ishedwcbstorc.icc.ch,justpub1.ishcdStayuptoda1.eona1.1.newIECpuMcat>or.JustPub1.sddtasa1.1.newpubcat>o5reteasedAvai1.ab1.eon1.ineandOnC8amonthWefnai1.IECCustomerServiceCentre-webstore,ec.ch-escHyouwishtogrv©USyourW1.ckonthispub1.icationorneedfurther35ststanco.p1.ease<11tacttheCus11crServiceCentre:sates»ec.ch.IECProducts&ServicesPorta1.-products.iec.chDiscoverourPowerIU1.searchengineandreadfree1.ya1.1.thePubiicatkxispreviews.graphica1.symbo1.sandth©grossary.Withasubscriptionyouw1.1.a1.wayshaveaccesstoup1.oda1.ententta(oredX>yourne«ds.E1.ectropedta-www.e1.edrope<fia.orgTbcwor1.dsIcacingon1.inedicborwryonccctrotcchnoogy.1.aningmorethan22500termnotogtetfentriesinEng1.sa11dFrenchwithOqUZa(Cn1.tefmSin25addf1.kxaUnu9gcsA1.soKnOWnasEeInternationa1.E9drotech11ca1.VocabUary(IEV)o11*11.Aproposde11EC1.aCOmfnISsonEJectrotechniqueIntefnaDonaIe(ICes1.IaPfgrnIEeorganisationmodiaequ1.ahoreetPubI哈desNormesIngrnagna1.eSpourtoutcequatra<!aMectricitdar*ctronquetau×Wchntfog»esapparents.Apropodespub1.icationsIEC1.eConIenUtechniquedespub1.icationsIECestCons1.anWTien1.revu.VeuiifezVoUSassurerqueVOUSposs6dezIedttionap1.usr6cenie.uncorrigendumouamendementPeU1.avoir66PUb1.i6.Recherchedepub1.icationsIEC-wet>store.iec.chadVsearchform1.ar<hcrctcva11coPefEmdeIrouvcrdc$PUbfCi1.bQnSIECnUHisantdiffre11tsCfiteresInUmfOdereference,1.itod,<udcs.E11cdo1111caussdcsinformationssurk»Pfoje1.Sa1.esPUbICaconsre<np1.acesourM33.IECJustPub1.ished-wet>s1.or.ec.ch,justpubhsedRostczinformdsurcs11ouvccspub1.icationsIECJustPub1.isheddwaIeSouve5puWica1.o11sparuesDisponibtecnIigncCtu11ck>isParmotsparCmaJ1.ServiceC1.ientswebsore.*ec.ch<ccSivous66reznousdonner<fescommenaressurce!½pub1.icationouSiVOuSavezdesquestionsco11taez-11ous:sa1.esPibc.c.IECProducts&ServicesPorta1.-products.1.ec.chOdcouvwznoir©putssa11(11x>wurderecherche©1nsUWzgratui1.ementIousIeeaerusdesPUbHMiO检Syrnbotesgraphjquse<tegossairAyeCunabomement.VOU6aurezEU)OUr$accd$au11COntCnU占jouradp*VQSbcsoi11s.E1.ectropedmwww.e1.ctrope<>taorg1.epremierdictionaifecf61.ecrocnoioeen1.neaumonde,avecp1.usde22500a11ctesIBEnO<ogqusenang1.ais©1efranais.nsiqe1.esefmes6quiva1.ensdans25Ianguesaddibo11e*sE9a1.mniappe<eVOCabU1.aKeEtectfotechniqueInjefnaionaJ(IEVenigne.IEC61189-2-720Edt>n1.0202403INTERNATIONA1.STANDARDNORMEINTERNATIONA1.Eco1.ourinsideTestmethodsfore1.ectrica1.materia1.s,circuitboardsandotherinterconnectionstructuresandassemb1.ies-Part2-720:DetectionofdefectsininterconnectionstructuresbymeasurementofcapacitanceMethodesd'essaipourIesmateriauxe1.ectriques,Iescartesimprimeesetautresstructuresd'interconnexionetensemb1.es-Partie2-720:DetectiondedefautspresentsdansIesstructures(!'interconnexionparmesuragedeIacapaciteINTERNATIONA1.E1.ECTROTECHNICA1.COMMISSIONCOMMISSIONE1.ECTROTECHNIQUEINTERNATIONA1.E»CS31.180ISBN978-2-322-83271Warning!F4akesurethatyouobtainedthispub1.icationfromanauthorizeddistributor.Attention!Veui1.1.ezvousassurerquevousavezobtenucettepub1.icationviaundistributeuragree.tfR*qcAr3o1.3>的fu!bEht*S9gvCsiescrUg8debCoFBc©CnE1.Mh:4E2<c<njrionaCONTENTSFOREWORD31 Scope52 Normativereferences53 Termsanddefinitions54 Objective.55 Testspecimen66 Testmethod67 Testprocedures78 Report8AnnexA(informative)Thecapacitivetestmethod9A1Testschematic9rFigure 1 -Capacitancedifferencedependingonthedefectofmousebite6Figure 2 -Testspecimen6Figure 3 -SchematicoftheCaPaa1.ancetestmethod7FigureA.1-Testschematic9TaWe1-DefGignofuppercase8TabAeA.1-Testresu1.t(orthetestspecimen10INTERNATIONA1.E1.ECTROTECHNICA1.COMMISSIONTESTMETHODSFORE1.ECTRICA1.MATERIA1.S,CIRCUITBOARDSANDOTHERINTERCONNECTIONSTRUCTURESANDASSEMB1.IES-Part2-720:DetectionofdefectsininterconnectionstructuresbymeasurementofcapacitanceFOREWORD11TheIrrtefnationaiEec1.roiechnica1.Commissjon(IEC)isaWoddWkfeOrgarizabonforstandardisationCOfrpcisingaM11abo11a1.rotech11ca1.<nmrtts(CNationa1.Co11m<t1.sTheOb用ofECstopromotei11Qemat>onacooperationona1.1.questionsconcerningstandardizationintheCicetnCa1.anddoc1.ro11ic潮ds.ToIhjSendandinaddontooteractcvUies.IECpuWsesMternationa1.Standards.Technica1.SPeCdEatk)ns.TeChnkaReports.PUbIiCbfAvai1.ab1.eSpecifications(PAS)andGuides(hereafterreferredtoas1ECPUWiCatiOMS)Thcrrearatkx)mittees;anyIECNationa1.CommitteeIniefestedinthesubjectdea1.twthmayPamoPa衿nth<sprj>araxxyworkInternationa1.,aovemmenta1.andnon-Qvernm111.aOnJaniZatjOn61.iaisingwithteIECa1.sop>a11icipateinthisPrepafacon.IECCd1.abofatesCtoee1.ytheIniemationaiOfgan1.zatkxikxStandardization(ISO)inaccordancewthoondnxsdtrminedbyagreementCetweentheMoorQaniZaIkX1.S2)Thekxma1.dedionsoragreementso!IEContechnica1.mattersexpress,asnear1.yasPgMiW*animanabona!consensuso1.OPin1.ononthere1.evantsubjectss1.mitteehas田PreSen1.at1.Ontroma1.i11xc5todIECNatkxia1.C(XnEHoeS3IECPub1.icationshaveIhekxmofrecommendationsf<xinernatia1.useandareacce½dbyIECNaiionaJCommt1.8Srthatsense.Witea1.1.reasonab1.etto11saremadetoensurethatthetechnica1.n1.e11tofIECPub1.icationsisaccrae.IECcannotbehe<dresponsib1.efortheWayinwN5theyareusedorforany(T)JsinierpfetaDonbyanyenduser.4Inordertopromoteimematxa1.uniformity.IECMat>onaJCommitteesundertaketoappIECPub1.ica1.ioasIraneparen1.1.yk>themaximumextentposab1.einIheirnationa1.andregtona1.PUb1.catjOx.AnydvergencebetweenanyIECPub1.cabonandtheCorrespondngnationa1.<xregiona1.PubUCaVonsha1.1.beCteartyindicatedMthe1.atter.5IECitse1.fdocsnotp11>v崛anyattcsta!on<Mco11kmityIndependentCCrtibCMkxibodiesPrQVidCconformityassessmentservicesand.Insomeareas,accesstoIECmarksOrconformity.IECisnotrsons1.bfekxanysrvcescarriedoutbyincSependentcertrf>caixbodies.61AJIUSorSshou1.densurethattheyhavethe1.atestodikofthspub1.ication.7NoIiabi1.tysha1.1.attachtoIECoritsdireckxs.emp1.oyees,servantsOfagentsindSngindividua1.expertsandmembersmitteesandIECNabona1.Committeesforanypersona1.11ury.propertydamageort>!herdamageofanynatureMaisoever.whetherdree!orindirec!.orfarcosts(inducing1.ega1.1.ewandexpensesarisingoutorIhePUb1.eaUOn.usecA.orre1.anceupon.th»sIECPub1.icationoranyoWfIECPubtcabons.8Attentionisdrawnk)theNocmaiwereferencescedInthispuMication.UseOI1.here4ererx½dpub1.icationsIndispensaWeforth©correctapp*caboofthisPUbheabOn9)IECdrawattentiontotheposst)iitythattheIEPkXnCEaIkxiofthisdocumentmayinvo1.vetheuseof（八）Paten1.(三).IECtakesnopositionConCem1.ngtheevidence,va1.idty,orapp1.icabi1.ityotanyCUjmedpatentrightsnrespectthereofAsofIhodax?dPUbIkatkxio!hisCiOCUrncntIEChadn(zrcc6,cdnoticeof（八）Partent、Whi6mayberequiredtoimp1.ementthisdbcumen1.HOWeVer.imKmenf9arecautionedthatthismaynotreren1.the1.atesti11kr11aiio11,whichmaybeobtainedSrOmthePaXJntdatabaseavai1.ab1.eathttps*,gcES.ioucIECsha1.1.notbehe1.dreepon&b1.e1.otKferrtifyinganyora1.suchpatentrights.IEC611892720hasbeenpreparedbyIECmittee91:E1.ectronicsassemb1.ytechno1.ogy.ItisanInternationa1.Standard.ThetextofthisInternationa1.Standardisbasedonthefo1.1.owingdocuments:Dra11Reportonv!ing91/1923.FDIS91/1934.RVOFu1.1.informationonthevotingfortheapprova1.ofthisInternationa1.Standardcanbefoundinthereportonvotingi11dscatedintheabovetab1.e.The1.anguageusedforthedeve1.opmentofthisInternationa1.StandardisEng1.ish.Thisdoc11wthasbeendraftedinaccordancewiththeISOIECDirectives.Part22,anddeve1.opedinaccordancewithISO.1ECDirectives,Part1andISQ,IECDirectives.IECSupp1.ement,avarfab1.eatvww.iec.ch,me11)bers-exprtsrefdocs.Themaindocumenttypesdeve1.opedbyIECaredescribedingreaterdetai1.atww.iec.ch.,pubfcca1.ions.A1.istofa1.1.partsintheIEC61189series,pub1.ishedunderthegenera1.tit1.eTestmethodsfore1.ectrica1.(natc11a)s.drcurtboardsandOnWSefCon水侬OnSVUCMeSandassemMgcanbefoundonthoIECwebsite.FuturestandardsnIhisserieswi1.1.carrythenewgenera1.tit1.eascitedaboveTit1.esofexistingstandardsinthisseriesvi1.beupdatedatthetimeofthenextedition.Thecom11rtteehasdecidedthatthe11tentsofthisdocumentwi1.1.remainunchangedunti1.thestabi1.itydateindicatedontheIECWebSitCunder'http：JMebS1.Orc.icc.ch”mIhcdatare1.atedtothespoficCtocumont.Atthisdate,thedocumentwi1.1.be reconfirmed, withdrawn,or revised.IMPORTANT一Th©"co1.ourinside"1.ogoonthevrpageofthisdocumentindicatesthatitcontainsco1.ourswhicharcconsideredtobeusefu1.forthecorrectunderstandingofitscontents.Usersshou1.dthereforeprintthisdocumentusingaco1.ourprinter.TESTMETHODSFORE1.ECTRICA1.MATERIA1.S,CIRCUITBOARDANDOTHERINTERCONNECTIONSTRUCTURESANDASSEMB1.IES-Part2-720:Detectionofdefectsininterconnectionstructuresbymeasurementofcapacitance1 ScopeThispartofIEC61189providesamethodtoeva1.uateSPeerfiCcharacteristicsOfdrcu1.boardsbymeasuringtheCaPaCitaneCbetweenconductortracesandagroundp1.aneandcanbeusedtorqaJ<tativecomparisonofatestspecimentoareferenceboard.ThismethodistintendedforquantitativemeasurementsandIorassessmentofnformitytoaspecification.2 NormativereferencesThefo1.1.owingdocumentsarereferredtointhetextinsuchawaythatsomeora1.1.oftheircontentconstitutesrequirementsofthisdocument.Fordatedreferences,Oniytheeditioncrtedapp1.ies.Forundatedreferences,the1.atesteditionofthereferenceddocument(inc1.udinganyamendments)app1.ies.IEC60194-2.Printedboardsdesign,manufactureandassemb1.y-Vocabuiary-Pan2:Commonusaffcinectr<wcgcnoog>sas、府0asprintedboardande1.ectronicassombty除ChnHogies3 TermsanddefinitionsForthepurposesofthis>cmnt.thetermsanddefinitionsgivenGIEC1.942app1.yNotermsanddefinitionsarefcstedinthisdocument.ISOandIECmaintaintermino1.ogica1.databasesforuseinstandardizationatthefo1.1.owingaddresses: IECEiec1.ropedia:avai1.ab1.eath11p>,wwweectropeda.org. ISOOnbnebrows*ngp1.atform:avai1.ab1.eath11p>7ww.isoorg.,obp4ObjectiveFortestinge1.ectrica1.characteristicsofdrcurtboard,genera1.1.yaneectrcaJOPerVShorttestthatsha1.1.measuretheresistancebetweennets«sthemamtestmethodThisOP(KVSh(X1.testISPaSSib1.COntytokx)katthef>assihefai1.ofcircuitsandnotto1.ookforanyre1.iabi1.ityissuesofcircuitboard1.ikeasmousebite.d<Hamnat>on.void,andcrack.Thercrore.thegenera1.e1.ectrica1.testhasabmtation.A1.ongwiththecapacitancetestmethod,theO1.CCtrICaItQStmethodsha1.1.chocktheexistingre1.iabi1.ityissuesofrcuitboardsandthisstandardizationoftheadditiona1.<HctricaJtest0necessaryfromthe(Jcvek>p11jntstageIt0posab1.etoaccurate1.ymeasurethedifferencesinthecapacitanceva1.uescircuitboardsbeforeanda1.terthere1.iabi1.itytest.This吟SUf1.iciontforthedeve1.opmentstageandro1.iaMitytestingratherthaninpfoduct>ontestingbecauseofthe1.ongtesttimeofe1.ectrica1.test.OtherthanthePfOmngcontactissues,thereisnoPrOHemwiththemeasurementuncertainty.Itispossib1.etok>oktordetectssuchasope'sort,mousebte,de1.amination,void,andsoonbyana1.ysingthetestdefectnets.In100kingforthecapacitancetestmethod,tShowSthecapatanceOitferencedependingonthepadwidth,padteng1.h,andpaddistanceasshownFigure1.Figure1ShOwSthedefectofmousebite.OmensonsInmIcrorTMIIifneCfesFigure1-Capacitancedifferencedependingonth©defectofmousebit©5TestspecimenFigure2ShOYzSthetestspecimenv/ithtoptestpadsandbottomtestpads.Itsha1.1.bpreparedtotestrea1.circuitboardsandtestcouponswithawarpagespecificationof1.essthan2mmtorimprovingadhesionwiththegroundmeta1.p1.ate.ToptestpadsBof1.omtestpadsFigure2-Testspecimen6TestmethodFigure3ShOwSIheschematicofthecapacitancetestmethodformeasuringcapacitanceusingacapacitancetestersuchasan1.CRmeterandImpedancetester.Aftercontactingthegroundmeta1.p1.ateofon©side,thecapacitanceofa1.1.ofpadsoftheothersideshaibetested.Thetopprobingtestsandth©bottomprobingtestsareconducted.PrOtMn9portirCapacitancetesterformeeauf1.ngthecep-18Groundmetop1.ate（八）Topprobingtestsfora1.1.toppads(b)Bottomprobingteststora1.1.bottompadsFigure3-Schematicofthecapacitancetestmethod7 TestproceduresThespecimensha1.1.beattached(othegroundmota1.p1.atewithoutanyattachedmateria1.s,anditmayneedthegrndmeta1.p1.atewiththevacuumsuctionho1.esforimprovingtheattachmentbetweentestspe11>enandgroundmeta1.p1.ate.The2-portcapatancetestersha1.1.be1111ectedateachprobingpointandgroundmeta1.p1.ate.If1.ookingatthetestschematicinFigureA.1.afterattachingthetestspecimentothegroundEGIa1.p1.ate,the2portimpedancetestersha1.1.be1111ectedtothepadsofth©testspecimenandgroundmeta1.p1.ate.Th©groundmeta1.p1.atesha1.1.bethecommongroundandthecapacitancesha1.1.bemeasuredateachone-sideprobingpoint.A1.so,itisnecessarytomeasureateachother-sideprobingpoint.Afterthat,itsha1.ana1.yzea1.1.thetestresu1.tsbymparingth©averageerrorrat100fa1.testspecimens.Thetestsequencestotestthecapacitanceofcircuitboardsareasfo1.1.ows