集成电路专业测试技术培训课程介绍.docx

Testing Training Brochure集成电路专业测试技术培训课程介绍Table of ContentIntroductionTraining by Teradyne China TAG 泰瑞达测试应用部技能发展培训TeradyneTeradyne, Inc. is the worlds largest supplier of automatic test equipment and is also a leading provider of high performance interconnection systems and electronic manufacturing services. Teradyne was founded in 1960 and became a publicly owned company in 1970. Its headquarters are in Boston, Massachusetts. 泰瑞达公司是全球最大的自动测试设备供应商，也是引领高性能互连系统和电子制造服务供应商。泰瑞达成立于1960年，在1970成为上市公司。公司总部设在马萨诸塞州的波士顿。Teradyne is a leading worldwide supplier of automatic test equipment for logic, RF, analog, power, mixed-signal, and memory technologies. We deliver test solutions to developers and manufacturers of a broad range of integrated circuits, packaged separately or integrated as cells in system-on-a-chip (SOC) devices. ICs tested by Teradyne are used in computing, communications, consumer, automotive, identification, and internet applications.泰瑞达是引领全球逻辑、RF、模拟、电源、混合信号、存储器技术的自动测试设备供应商。我们为集成电路开发人员和制造商提供测试解决方案，无论独立封装或整合成片上系统（SOC）的器件。经由泰瑞达测试的集成电路广泛应用于计算机、通讯、消费电子、汽车电子、身份识别和互联网应用。Our semiconductor test system customers include electronic component manufacturers and fabless subcontractors to the semiconductor industry. To find out more about Teradyne, please visit our website at 我们的半导体测试系统的客户包括电子元件制造商、设计厂商等半导体业界诸多公司。想要了解更多的信息，请浏览我们的网站：Test Applications Group (TAG) Recognized as the world's leading professional services organization for semiconductor device testers, Teradyne's Test Applications Group (TAG) delivers Total Test Solutions worldwide. From design to high volume production, TAG's applications engineers are specialists in linear, mixed-signal, logic and memory testing devices. This value-added support includes test cell integration, test program and hardware development, tools for test productivity and skill development training. Teradyne 测试应用部门是全球领先的为半导体器件测试人员提供服务的专业机构，为半导体业界客户提供全套的测试解决方案。从设计到量产，TAG的应用工程师都是线性、混合信号、逻辑电路和存储器测试方面的专家。这种有附加值的技术支持包括测试单元的集成、测试程序与硬件的开发、量产测试的工具和技能发展培训。For years, Teradyne's customers have benefited from the device test expertise of Test Applications Group (TAG) engineers. This expertise, acknowledged by TAG's reputation as the leading professional services organization for semiconductor device testers, is continuously enhanced through up-to-date technical training and skill development courses, all of which are available for your engineers and technicians. Deployed globally in regional Technical Centers, TAG's technical training and skill development courses can also be delivered on site by TAG-certified instructors多年来，Teradyne的客户已经得益于TAG工程师的测试经验。这些专业的测试工程师，作为公认的半导体器件测试提供服务的专业机构，不断致力于发展与日新月异的技术相承附的专业技术培训和技能培养课程，从事测试行业的的工程师和技术人员能够从这些课程中受益。除了在遍布全球的Teradyne培训中心提供培训，TAG认证的讲师也可以现场为您提供专业技术培训和技能发展课程。人人都可以用测试设备和计算机做联系标准的培训课程普通话教学经泰瑞达授权的培训中心易懂的培训教材经验丰富的讲师Experienced Instructors: Lee(LiGuo ) ZhangEXPERIENCESMIC, Shanghai, China 中芯国际集成电路制造（上海）有限公司07/01 PresentDesign Service Technical Director 设计服务技术经理EXPERIENCESIEMENS Microelectronics., Munich, Germany (Delegation)SIEMENS Microelectronics., Dresden Fab., Germany 德国慕尼黑西门子微电子（授权） 德国德累斯顿 Fab西门子微电子05/97 07/01 Sr. Product/Testing Development Manager 产品/测试开发部资深经理.EXPERIENCELATTICE SEMICONDUCTOR CORP., California, USA 美国加利福尼亚Lattice半导体公司 09/94 05/97 Manager/Senior Product & Test Development Engineer 产品/测试开发补资深经理EXPERIENCEATMEL CORPORATION, California, USA 美国加利福尼亚ATMEL 有限公司 08/91 09/94 Sr. Product and Test Engineer in Microcontroller Group. 微控制器产品/测试资深工程师EXPERIENCEDEINIPPON MANUFACTURING PRINTER CO., JAPAN06/85 03/89 Circuit and System Design EngineerTraining Course CatalogTraining Course Catalog课程目录v IC testing KnowledgeDigital Signal IC测试技术基础数字信号部分v Digital Signal Testing knowledge（Level one） 数字信号测试技术基础（初级篇）v Digital Signal Testing knowledge（Level two） 数字信号测试技术基础（高级篇）v IC testing KnowledgeMixed Signal IC测试技术基础混合信号部分v Mixed Signal Testing knowledge（Level one） 混合信号测试技术基础（初级篇）v Mixed Signal Testing knowledge （Level two）混合信号测试技术基础（高级篇）v IC testing KnowledgeMemory Testing IC测试技术基础存储器测试技术部分v Memory Testing knowledge 存储器测试技术基础v IC testing Knowledge RF/uWave Fundamental IC测试技术基础射频测试技术部分v RF/uWave Testing Knowledge射频测试技术基础Detail Course DescriptionDigital Signal Testing knowledge（Level one）数字信号测试技术基础（初级篇）Course Description 课程描述This course is designed to explain the concepts and techniques used in testing (digital) semiconductors. This course is not tester specific. An overview of the test requirements of the semiconductor industry is presented as well as practical information pertaining to test program development, debugging techniques and yield analysis. DC, AC and Functional tests are discussed in detail. 这个课程解释了（数字）半导体测试的概念和方法。课程不针对特定的测试设备进行讲解。概括介绍了半导体工业测试需求、测试程序的开发、现场调试技术及产量分析等。同时详尽介绍了DC、AC参数测试和芯片功能测试。With Standard Exam Paper附有标准的试卷Duration 课程时间10 Hours 10小时Recommended attendee 推荐参加人员：Fresh graduates, Applying job in semiconductor industry毕业大学生，有志于从事半导体行业Fresh engineer of semiconductor industry半导体行业工程师 01年经验Production support engineer产品工程师 01年经验Application engineer应用工程师 01年经验Digital Signal Testing knowledge（Level two）数字信号测试技术基础（高级篇）Course Description 课程描述This course is designed to explain the concepts and techniques with great experience in digital part of testing. This course gives an overview of more advanced knowledge in semiconductor testing, which is presented as well as practical information pertaining to test program development, design debugging techniques and failure analysis. The detail knowledge of DC, AC and Functional tests are discussed in detail. 这个课程利用大量数字器件测试经验来解释测试的概念和技术。课程提供了先进的半导体测试知识的概述，以及测试程序、现场调试技术和故障分析等。详细的讨论DC、AC和功能性测试的知识。With Standard Exam Paper附有标准的试卷Duration 课程时间10 Hours 10小时Recommended attendee 推荐参加人员：Testing engineers with few years work experience in semiconductor industry or related industry从事半导体行业或相关行业经验的测试工程师 1年以上经验Product engineers or production / manufacturing engineers产品工程师或生产、制造业工程师 1年以上经验Application or sales engineers serve in semiconductor area半导体行业应用或销售工程师 1年以上经验IC design engineersIC设计工程师 1年以上经验Mixed Signal Testing Knowledge（Level one）混合信号测试技术基础（初级篇）Course Description 课程描述This course is designed to explain the concepts and techniques used in testing (mixed-signal) semiconductors. This course is not tester specific. The purpose of this training is to have you understand the components of a mixed signal test system, the principles of sampling theory and how to correctly sample an analog signal, how to create an analog signal for a DUT with a waveform generator, some typical DSP algorithms and when and how they should be used. Lastly how to extract test measurements from sampled data and relate them to device specifications. 这个课程概括了混合信号测试的概念和方法。课程不针对特定的测试设备进行介绍。培训的目的是介绍混合信号测试系统的组成，采样理论及如何正确的采样模拟信号等，以及如何用波形发生器为芯片建立模拟信号，如何在具体应用中选用典型的DSP算法。课程还介绍了如何从采样数据中确立测试方法并与芯片的参数相联系等的具体内容。With Standard Exam Paper附有标准的试卷Duration 课程时间8 Hours 8小时Recommended attendee 推荐参加人员：Fresh graduates, Applying job in semiconductor industry刚毕业大学生，有志于从事半导体行业Fresh engineer of semiconductor industry进入半导体行业的工程师 01.5年经验Production support engineer生产工程师 01.5年经验Application engineer应用工程师 01.5年经验Mixed Signal Testing Knowledge（Level two）混合信号测试技术基础（高级篇）Course Description 课程描述This course is designed to explain the detail concepts with technical application in mixed-signal testing. This course is not tester oriented. The purpose of this training is to have you understand the specifications of a mixed signal with design related knowledge, the principles of sampling theory and how to correctly sample an analog signal, how to create an analog signal from design idea to testing establishment. Lastly how to extract test measurements from sampled data and relate them to device specifications. 这个课程说明了混合信号测试应用技术的详细概念，课程不是以测试设备为导向的。培训的目的是介绍与混合信号有关的设计知识，采样理论和如何正确采样模拟信号的原则，如何从设计理念到测试设备来创造一个模拟信号，最后介绍如何从采样数据中选用正确的测试方法并与芯片参数规范相联系的方法。With Standard Exam Paper附有标准的试卷Duration 课程时间12 Hours 12小时Recommended attendee 推荐参加人员：Testing engineers with few years work experience in semiconductor industry or related industry从事半导体行业或相关行业经验的测试工程师 1.5年经验以上Product engineers or production / manufacturing engineers生产工程师或产品、制造业工程师 1.5年经验以上Application or sales engineers serve in semiconductor area半导体行业应用或销售工程师 1.5年经验以上IC design engineersIC设计工程师 1.5年经验以上RF/uWave Testing Knowledge射频测试技术基础Course Description 课程描述This class is aimed to introduce common terms used in the microwave-testing environment. Pictures and diagrams are attached to terminology and components to illustrate the concepts.这个课程介绍射频测试中技术术语，并使用图片和图表进一步阐述这些概念It is meant for engineers with little microwave knowledge background. It also allows engineers to efficiently increase their understanding of microwave terminology, components and systems. The slides are prepared to explain microwave theory in simple words without complex mathematics.这个课程对缺少射频知识背景的工程师很有价值。同样，也能能让工程师有效地增长与微波术语、测试及系统相关的知识。这个课程使用简单的语言和图片图表来解释复杂的微波理论。Duration 课程时间20 Hours 20小时Recommended attendee 推荐参加人员： Fresh graduates, Applying job in semiconductor industry刚毕业大学生，有志于从事半导体行业工作 Fresh engineer of semiconductor industry半导体行业的工程师 02年经验Cost GuidelineDigital Signal Testing Knowledge（level one）数字信号测试技术基础（初级篇） Cost: RMB 2000Class Size: 30 trainees/ Minimum 40 trainees/ MaximumDigital Signal Testing Knowledge（level two）数字信号测试技术基础（高级篇）Cost: RMB 3000Class Size: 20 trainees/ Minimum 40 trainees/ MaximumMixed Signal Testing Knowledge（level one）混合信号测试技术基础（初级篇）Cost: RMB 2000Class Size: 30 trainees/ Minimum 40 trainees/ MaximumMixed Signal Testing Knowledge（level two）混合信号测试技术基础（高级篇）Cost: RMB 3000Class Size: 20 trainees/Minimum 40 trainees/MaximumMemory Testing Knowledge存储器测试技术基础Cost: RMB 2000Class Size: 30 trainees/Minimum 40 trainees/MaximumRF/uWave Testing Knowledge射频测试技术基础Cost: RMB 2000Class Size: 20 trainees/Minimum 40 trainees/ MaximumCourse OutlineDigital Signal Testing knowledge（Level one）数字信号测试技术基础（初级篇）内容提要TopicDescription第一天课前沟通简单测验(1小时)半导体测试概念介绍1. 半导体测试概念2. 芯片测试规范3. 连接性测试直流参数测试直流参数测试介绍芯片功能性测试芯片功能测试介绍第二天交流参数测试交流 参数测试介绍其他1. DFT (Design For Test)可测性芯片设计2. CMOS Latch-Up课后练习课后练习(2小时)Trainer 讲师：Stella Wang 王镇Maggie zhao 赵咏梅Mixed Signal Testing Knowledge（Level one）混合信号测试技术基础（初级篇）内容提要TopicDescription第一天课前练习课前小测验(1小时)混合信号测试概述1. 混合信号测试概念2.混合信号测试机台结构3. 典型的混合信号测试机台介绍4. 典型混合信号测试参数介绍混合信号测试理论1. 采样和重建理论2. 采样定律和混叠现象第二天3. 采样噪声4. 相关采样定律模数转换器的测试1.模数转换器的静态参数概念2. 模数转换器的静态参数测试方案3.模数转换器的动态参数概念4.模数转换器的动态参数测试方案第三天数模转换器的测试1.数模转换器的静态参数概念2.数模数转换器的静态参数测试方案3.数模转换器的动态参数概念4.数模转换器的动态参数测试方案课后练习课后小测验(2小时)Trainer 讲师：Steven Li 李帆Simon Chen 陈宰曼Digital Signal Testing knowledge（Level two）数字信号测试技术基础（高级篇）内容提要TopicDescription第一天半导体测试概念概述1. 半导体测试分类及生产流程2. ATE自动测试机台介绍3. 测试中的常用术语4. 测试理论与测试流程5. 术语表及段落总结半导体测试1. 测试方法的正确思路2. DUT测试芯片3. 测试程序4. 测试机台5. 测试工程师工作原则6. 测试芯片的常用术语7. 其他测试条件测试规范1. 设计规范2. 测试规范3. 芯片规范4. 测试条件及测试门限5. 直流测试中的参数6. 交流测试中的参数7. 逻辑功能和存贮器功能DC参数测试1. 为什么要进行连接性测试2. IDD(Gross)测试3. IDD(静态)测试4. IDD(动态)测试5. Vol/Voh和Vil/Vih测试6. 输入电流Iil/Iil测试7. 输入端上拉和下拉电阻第二天功能性参数测试1. 功能性测试概念2. 测试周期3. 输入输出数据和向量4. 运行功能性测试5. 功能性(Gross)测试6. Vol/Voh和Vil/Vih的功能性测试方法7. 高阻态输出电流Ioz的功能性测试交流参数测试1. 交流参数测试概念2. Go-Nogo判断测试流程3. 信号建立时间4. 信号保持时间5. 传播延时的测量6. 最小时钟宽度8. 最大频率测试程序开发1. 测试程序的目的2. 测试程序开发流程3. 初始化程序4. 校验测试环境5. 上电和下电顺序6. 芯片分级处理7. 总结Trainer 讲师：Lee (LiGuo) zhang 张理国Stella Wang 王镇Mixed Signal Testing Knowledge（Level two）混合信号测试技术基础（高级篇）内容提要TopicDescription第一天直流和参数测试1. 连接性测试2. 漏电流3. 电源电流4. 直流参考电压及校准5. 电阻测量6. 直流偏置测量7. 直流放大系数测量模拟信号理论1. 采样和重建2. 量化误差3. 相关采样第二天模拟信号通路测试1. 模拟信号类型概述2. 放大系数和电平测试3. 信号失真测试4. 信噪比和信号失真采样通路测试1. 采样信道2. 采样中需要考虑的问题3. 编码和解码4. 采样信道测试第三天数模转换器测试1. 转换器测试基础2. 直流测试3. 转换器曲线测试4. 转换器动态参数测试5. 模数转换器结构模数转换器测试1. 数模转换器和模数转换器测试的区别2. 数模转换器编码边界测试3. 直流和转换曲线测试4. 模数转换器动态参数测试5. 转换器曲线测试6. 典型模数转换器的测试Trainer 讲师：Lee (LiGuo) zhang 张理国Simon Chen 陈宰曼Memory Testing Knowledge存贮器测试技术基础内容提要TopicDescription第一天非永久性存贮器概述1. 非永久性存贮器2. 非永久性存贮器的评估3. 浮门芯片4. 电荷注入机制电可擦只读存贮器和闪存1. 可擦除可编程的只读存贮器2. 电可擦除可编程的只读存贮器(EEPROM)3. EEPROM的结构4. 闪存的工作机制5. 存贮器的或非门工作结构6. 存贮器的或非门工作机制相关事项7. 嵌入式闪存第二天闪存测试1. 存贮器测试概述2. 闪存测试方面3. 闪存测试的测试工具4. 直接访问内存5. Vt测试6. Stress模式7. 损耗和低Vt测试易测性和存贮单元修复1. 大生产测试2. 测试的能力3. 产品特性表述第三天存贮器的可靠性介绍1. 可靠性概要2. 存贮器序列Vt分配3. 存贮器序列氧化缺陷4. 主要的与良率和可靠性相关的事项存贮器可靠性测试方法1. 可靠性测试概要2. 存贮单元的耐受力3. 多级存贮可靠性4. 可靠性测试的结论 附加的EEPROM的测试方法1. EEPROM的测试方法Trainer 讲师：Lee (LiGuo) zhang 张理国Edmond Tan 谈圣杰RF/uWave Testing Knowledge射频测试技术基础内容提要Description第一天1. 什么是微波?2. 常用术语和简写3. 微波技术运用介绍4. 传输线理论 传输线举例 标准波理论5. 从时域到频域6. 采样的概念第二天7. 微波的构成8. 散射参数9. 在ATE上测试的微波芯片10. 典型的微波芯片测试项Teradyne泰瑞达公司微波测试仪器介绍Trainer 讲师：Simon Chen 陈宰曼